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CDC2351-EP-具有三态输出的增强型产品 1 线路至 10 线路时钟驱动器
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TI产品 - CDC2351-EP介绍

CDC2351-EP - 具有三态输出的增强型产品 1 线路至 10 线路时钟驱动器

CDC2351-EP是TI德州仪器公司的一款单端产品,CDC2351-EP是具有三态输出的增强型产品 1 线路至 10 线路时钟驱动器,本站介绍了CDC2351-EP的封装应用图解、特点和优点、功能等,并给出了与CDC2351-EP相关的TI元器件型号供参考。

CDC2351-EP - 具有三态输出的增强型产品 1 线路至 10 线路时钟驱动器 - 单端 - 时钟缓冲器 - 德州仪器

产品描述

The CDC2351 is a high-performance clock-driver circuit that distributes one input (A) to 10 outputs (Y) with minimum skew for clock distribution. The output-enable (OE)\ input disables the outputs to a high-impedance state. Each output has an internal series damping resistor to improve signal integrity at the load. The CDC2351 operates at nominal 3.3-V VCC.

The propagation delays are adjusted at the factory using the P0 and P1 pins. The factory adjustments ensure that the part-to-part skew is minimized and is kept within a specified window. Pins P0 and P1 are not intended for customer use and should be connected to GND.

The CDC2351M is characterized for operation over the full military temperature range of –55°C to 125°C.

产品特性

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Low Output Skew, Low Pulse Skew for Clock-Distribution and Clock-Generation Applications
  • Operates at 3.3-V VCC
  • LVTTL-Compatible Inputs and Outputs
  • Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
  • Distributes One Clock Input to 10 Outputs
  • Outputs Have Internal Series Damping Resistor to Reduce Transmission Line Effects
  • Distributed VCC and Ground Pins Reduce Switching Noise
  • State-of-the-Art EPIC-IIB™ BiCMOS Design Significantly Reduces Power Dissipation
  • Shrink Small-Outline (DB) Package

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. EPIC-IIB is a trademark of Texas Instruments.

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