SCAN25100 - 具有自动重新同步和精密延迟校准测量功能的 2457.6、1228.8 和 614.4 Mbps CPRI 串行器/解串器

SCAN25100是TI德州仪器公司的一款电信和无线串行器/解串器产品，SCAN25100是具有自动重新同步和精密延迟校准测量功能的 2457.6、1228.8 和 614.4 Mbps CPRI 串行器/解串器，本站介绍了SCAN25100的封装应用图解、特点和优点、功能等，并给出了与SCAN25100相关的TI元器件型号供参考。

SCAN25100 - 具有自动重新同步和精密延迟校准测量功能的 2457.6、1228.8 和 614.4 Mbps CPRI 串行器/解串器 - 电信和无线串行器/解串器 - 串行器、解串器 - 德州仪器

产品描述

The SCAN25100 is a 2457.6, 1228.8, and 614.4 Mbps serializer/deseralizer (SerDes) for high-speed bidirectional serial data transmission over FR-4 printed circuit board backplanes, balanced cables, and optical fiber. The SCAN25100 integrates precision delay calibration measurement (DCM) circuitry that measures link delay components to better than ± 800 ps accuracy.

The SCAN25100 features independent transmit and receive PLLs, on-chip oscillator, and intelligent clock management circuitry to automatically perform remote radio head synchronization and reduce the cost and complexity of external clock networks.

The SCAN25100 is programmable though an MDIO interface as well as through pins, featuring configurable transmitter de-emphasis, receiver equalization, speed rate selection, internal pattern generation/verification, and loop back modes. In addition to at-speed BIST, the SCAN25100 includes IEEE 1149.1 and 1149.6 testability.

产品特性

Exceeds LV and HV CPRI Voltage and Jitter Requirements
2457.6, 1228.8, and 614.4 Mbps Operation
Integrated Delay Calibration Measurement (DCM) Directly Measures T14 and Toffset Delays to ≤ ± 800 ps
DCM Also Measures Chip and Other Delays to ≤ ± 1200 ps Accuracy
Deterministic Chip Latency
Independent Transmit and Receive PLLs for Seamless RE Synchronization
Low Noise Recovered Clock Output
Requires No Jitter Cleaning in Single-Hop Applications
>8 kV ESD on the CML IO, >7 kV on All Other Pins, >2 kV CDM
Hot Plug Protection
LOS, LOF, 8b/10b Line Code Violation, Comma, and Receiver PLL Lock Reporting
Programmable Hyperframe Length and Start of Hyperframe Character
Programmable Transmit De-Emphasis and Receive Equalization With On-Chip Termination
Advanced Testability Features
- IEEE 1149.1 and 1149.6
- At-Speed BIST Pattern Generator/Verifier
- Multiple Loopback Modes
1.8V or 3.3V Compatible Parallel Bus Interface
100-pin HTQFP Package with Exposed Dap
Industrial –40 to +85° C Temperature Range

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