SN74ACT16373-EP - 具有三态输出的增强型产品 16 位 D 类透明锁存器

SN74ACT16373-EP是TI德州仪器公司的一款D类锁存器产品，SN74ACT16373-EP是具有三态输出的增强型产品 16 位 D 类透明锁存器，本站介绍了SN74ACT16373-EP的封装应用图解、特点和优点、功能等，并给出了与SN74ACT16373-EP相关的TI元器件型号供参考。

SN74ACT16373-EP - 具有三态输出的增强型产品 16 位 D 类透明锁存器 - D类锁存器 - 触发器/锁存器/寄存器 - 德州仪器

产品描述

The SN74ACT16373Q-EP is a 16-bit D-type transparent latch with 3-state outputs, designed specifically for driving highly capacitive or relatively low-impedance loads. It is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

This device can be used as two 8-bit latches or one 16-bit latch. The Q outputs of the latches follow the data (D) inputs if the latch-enable (LE) input is taken high. When LE is taken low, the Q outputs are latched at the levels set up at the D inputs.

A buffered output-enable (OE)\ input can be used to place the outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines in a bus-organized system, without need for interface or pullup components.

OE\ does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree
Member of the Texas Instruments Widebus™ Family
Inputs Are TTL-Voltage Compatible
3-State Bus Driving True Outputs
Full Parallel Access for Loading
Distributed VCC and GND Pins Minimize High-Speed Switching Noise

Widebus is a trademark of Texas Instruments. Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, highly accelerated stress test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

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