SN74HC10-EP - 增强型产品三路 3 输入正与非门

SN74HC10-EP是TI德州仪器公司的一款与非门产品，SN74HC10-EP是增强型产品三路 3 输入正与非门，本站介绍了SN74HC10-EP的封装应用图解、特点和优点、功能等，并给出了与SN74HC10-EP相关的TI元器件型号供参考。

SN74HC10-EP - 增强型产品三路 3 输入正与非门 - 与非门 - 门 - 德州仪器

产品描述

The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function Y = (A • B • C)\ or Y = A\ + B\ + C\ in positive logic.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 20-µA Max ICC
Typical tpd = 9 ns
±4-mA Output Drive at 5 V
Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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