

SN74HC253-EP是TI公司的一款解码器/编码器/多路复用器产品,SN74HC253-EP是具有三态输出的增强型产品双路 4 线路至 1 线路数据选择器/多路复用器,本页介绍了SN74HC253-EP的产品说明、应用、特性等,并给出了与SN74HC253-EP相关的TI元器件型号供参考。
SN74HC253-EP - 具有三态输出的增强型产品双路 4 线路至 1 线路数据选择器/多路复用器 - 解码器/编码器/多路复用器 - 特殊逻辑 - TI公司(Texas Instruments,德州仪器)
Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections.
The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives the bus line to a high or low logic level. Each output has its own output-enable (OE)\ input. The outputs are disabled when their respective OE\ is high.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of 40°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 3-State Version of HC153
- Wide Operating Voltage Range of 2 V to 6 V
- High-Current Inverting Outputs Drive Up To 15 LSTTL Loads
- Low Power Consumption, 80-µA Max ICC
- Typical tpd = 9 ns
- ±6-mA Output Drive at 5 V
- Low Input Current of 1 µA Max
- Permit Multiplexing From n Lines to One Line
- Perform Parallel-to-Serial Conversion
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

