SN74LV4052A-EP - 增强型产品双路 4 通道模拟多路复用器/多路解复用器

SN74LV4052A-EP是TI德州仪器公司的一款模拟多路复用器/多路解复用器产品，SN74LV4052A-EP是增强型产品双路 4 通道模拟多路复用器/多路解复用器，本站介绍了SN74LV4052A-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LV4052A-EP相关的TI元器件型号供参考。

SN74LV4052A-EP - 增强型产品双路 4 通道模拟多路复用器/多路解复用器 - 模拟多路复用器/多路解复用器 - 多路复用器/多路解复用器(Mux/Demux) - 德州仪器

产品描述

This dual 4-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.

The SN74LV4052A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 105°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Support Mixed-Mode Voltage Operation on All Ports
Fast Switching
High On-Off Output-Voltage Ratio
Low Crosstalk Between Switches
Extremely Low Input Current
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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SN74LV4052A-EP - 增强型产品双路 4 通道 模拟多路复用器/多路解复用器

SN74LV4052A-EP - 增强型产品双路 4 通道模拟多路复用器/多路解复用器