SN74LVC1G17-EP - 增强型产品单路施密特触发缓冲器

SN74LVC1G17-EP是TI德州仪器公司的一款无产品，SN74LVC1G17-EP是增强型产品单路施密特触发缓冲器，本站介绍了SN74LVC1G17-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LVC1G17-EP相关的TI元器件型号供参考。

SN74LVC1G17-EP - 增强型产品单路施密特触发缓冲器 - 无 - 小尺寸逻辑器件 - 德州仪器

产品描述

This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G17 contains one buffer and performs the Boolean function Y = A. The device functions as an independent buffer, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT-) signals.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Qualification Pedigree(1)
Supports 5-V VCC Operation
Max tpd of 4.6 ns at 3.3 V
Low Power Consumption, 10 µA Max ICC
±24 mA Output Drive at 3.3 V
Ioff Supports Partial Power Down Mode Operation
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.NanoStar, NanoFree are trademarks of Texas Instruments.

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