UC2832-EP - 增强型产品精密低压降线性控制器

UC2832-EP是TI德州仪器公司的一款LDO控制器（外部FET)产品，UC2832-EP是增强型产品精密低压降线性控制器，本站介绍了UC2832-EP的封装应用图解、特点和优点、功能等，并给出了与UC2832-EP相关的TI元器件型号供参考。

UC2832-EP - 增强型产品精密低压降线性控制器 - LDO控制器（外部FET) - 线性稳压器(LDO) - 德州仪器

产品描述

The UC2832 series of precision linear regulators include all the control functions required in the design of very low dropout linear regulators. Additionally, they feature an innovative duty-ratio current limiting technique which provides peak load capability while limiting the average power dissipation of the external pass transistor during fault conditions. When the load current reaches an accurately programmed threshold, a gated-astable timer is enabled, which switches the regulator’s pass device off and on at an externally programmable duty-ratio. During the on-time of the pass element, the output current is limited to a value slightly higher than the trip threshold of the duty-ratio timer. The constant-current-limit is programmable on the UC2832 to allow higher peak current during the on-time of the pass device. With duty-ratio control, high initial load demands and short circuit protection may both be accommodated without extra heat sinking or foldback current limiting. Additionally, if the timer pin is grounded, the duty-ratio timer is disabled, and the IC operates in constant-voltage/constant-current regulating mode.

These IC’s include a 2 Volt (±1%) reference, error amplifier, UVLO, and a high current driver that has both source and sink outputs, allowing the use of either NPN or PNP external pass transistors. Safe operation is assured by the inclusion of under-voltage lockout (UVLO) and thermal shutdown.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 85°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree
Precision 1% Reference
Over-Current Sense Threshold Accurate to 5%
Programmable Duty-Ratio Over-Current Protection
4.5 V to 36 V Operation
100 mA Output Drive, Source or Sink
Under-Voltage Lockout
Adjustable Current Limit to Current Sense Ratio
Separate +VIN terminal
Programmable Driver Current Limit
Access to VREF and E/A(+)
Logic-Level Disable Input

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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