CD74HC08-EP - 增强型产品四路 2 输入正与门

CD74HC08-EP是TI德州仪器公司的一款与门产品，CD74HC08-EP是增强型产品四路 2 输入正与门，本站介绍了CD74HC08-EP的封装应用图解、特点和优点、功能等，并给出了与CD74HC08-EP相关的TI元器件型号供参考。

CD74HC08-EP - 增强型产品四路 2 输入正与门 - 与门 - 门 - 德州仪器

产品描述

The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Buffered Inputs
Typical Propagation Delay 7 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
Fanout (Over Temperature Range)
- Standard Outputs ... 10 LSTTL Loads
- Bus Driver Outputs ... 15 LSTTL Loads
Balanced Propagation Delay and Transition Times
Significant Power Reduction Compared to LSTTL Logic ICs
2-V to 6-V VCC Operation
High Noise Immunity NIL or NIH = 30% of VCC at VCC = 5 V
CMOS Input Compatibility, Il 1 µA at VOL, VOH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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