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LM5060-Q1 - 具有低静态电流的高侧保护控制器
LM5060-Q1是TI德州仪器公司的一款热插拔控制器(正48V)产品,LM5060-Q1是具有低静态电流的高侧保护控制器,本站介绍了LM5060-Q1的封装应用图解、特点和优点、功能等,并给出了与LM5060-Q1相关的TI元器件型号供参考。
LM5060-Q1 - 具有低静态电流的高侧保护控制器 - 热插拔控制器(正48V) - 保护、监控和热插拔 - 德州仪器
The LM5060 high-side protection controller provides intelligent control of a high-side N-Channel MOSFET during normal on/off transitions and fault conditions. In-rush current is controlled by the nearly constant rise time of the output voltage. A power good output indicates when the output voltage reaches the input voltage and the MOSFET is fully on. Input Under-Voltage Lock-Out, with hysteresis, is provided as well as programmable input Over-Voltage Protection. An enable input provides remote On / Off control. The programmable Under-Voltage Lock-Out input can be used as second enable input for safety redundancy. A single capacitor programs the initial start-up VGS fault detection delay time, the transition VDS fault detection delay time, and the continuous Over-Current VDS fault detection delay time. When a detected fault condition persists longer than the allowed fault delay time, the MOSFET is latched off until either the Enable input or the Under-Voltage Lock-Out input is toggled low and then high.
- Available in Automotive Grade / AEC Q-100
- Wide Operating Input Voltage Range: +5.5V to +65V
- Less than 15 µA Quiescent Current in Disabled Mode
- Controlled Output Rise Time for Safe Connection of Capacitive Loads
- Charge Pump Gate Driver for External N-Channel MOSFET
- Adjustable Under-Voltage Lock-Out (UVLO) with Hysteresis
- UVLO Serves as Second Enable Input for Systems Requiring Safety Redundancy
- Programmable Fault Detection Delay Time
- MOSFET Latched off After Load Fault is Detected
- Active Low Open Drain POWER GOOD (nPGD) Output
- Adjustable Input Over-Voltage Protection (OVP)
- Immediate Restart After Over-Voltage Shutdown
Package
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