SN54BCT8373A - 具有八路 D 类锁存器的扫描测试设备

SN54BCT8373A是TI德州仪器公司的一款边界扫描(JTAG)逻辑产品，SN54BCT8373A是具有八路 D 类锁存器的扫描测试设备，本站介绍了SN54BCT8373A的封装应用图解、特点和优点、功能等，并给出了与SN54BCT8373A相关的TI元器件型号供参考。

SN54BCT8373A - 具有八路 D 类锁存器的扫描测试设备 - 边界扫描(JTAG)逻辑 - 特殊逻辑 - 德州仪器

产品描述

The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches.

In the test mode, the normal operation of the SCOPETM octal latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations, as described in IEEE Standard 1149.1-1990.

Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54BCT8373A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8373A is characterized for operation from 0°C to 70°C.

产品特性

Members of the Texas Instruments SCOPETM Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to 'F373 and 'BCT373 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPETM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
- Parallel Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
SCOPE is a trademark of Texas Instruments Incorporated.

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