SN74AC373-EP - 具有三态输出的增强型产品八路 D 类透明锁存器

SN74AC373-EP是TI德州仪器公司的一款D类锁存器产品，SN74AC373-EP是具有三态输出的增强型产品八路 D 类透明锁存器，本站介绍了SN74AC373-EP的封装应用图解、特点和优点、功能等，并给出了与SN74AC373-EP相关的TI元器件型号供参考。

SN74AC373-EP - 具有三态输出的增强型产品八路 D 类透明锁存器 - D类锁存器 - 触发器/锁存器/寄存器 - 德州仪器

产品描述

This 8-bit latch features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

The eight latches are D-type transparent latches. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the logic levels set up at the D inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines in bus-organized systems without need for interface or pullup components.

OE\ does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 6-V VCC Operation
Inputs Accept Voltages to 6 V
Max tpd of 9.5 ns at 5 V
3-State Noninverting Outputs Drive Bus Lines Directly
Full Parallel Access for Loading

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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