SN74AHCT00-EP是TI公司的一款与非门产品，SN74AHCT00-EP是增强型产品四路 2 输入正与非门，本页介绍了SN74AHCT00-EP的产品说明、应用、特性等，并给出了与SN74AHCT00-EP相关的TI元器件型号供参考。
SN74AHCT00-EP - 增强型产品四路 2 输入正与非门 - 与非门 - 门 - TI公司（Texas Instruments，德州仪器）
The ’AHCT00 device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- Inputs Are TTL-Voltage Compatible
- Latch-Up Performance Exceeds 250 mA Per JESD 17
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetalliclife, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
