SN74AHCT74-EP - 具有清零和预设功能的增强型产品双路上升沿 D 类触发器

SN74AHCT74-EP是TI德州仪器公司的一款D类触发器产品，SN74AHCT74-EP是具有清零和预设功能的增强型产品双路上升沿 D 类触发器，本站介绍了SN74AHCT74-EP的封装应用图解、特点和优点、功能等，并给出了与SN74AHCT74-EP相关的TI元器件型号供参考。

SN74AHCT74-EP - 具有清零和预设功能的增强型产品双路上升沿 D 类触发器 - D类触发器 - 触发器/锁存器/寄存器 - 德州仪器

产品描述

The SN74AHCT74 is a dual positive-edge-triggered D-type flip-flop.

A low level at the preset (PRE)\ or clear (CLR)\ inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Inputs Are TTL-Voltage Compatible
EPIC™ (Enhanced-Performance Implanted CMOS) Process
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. EPIC is a trademark of Texas Instruments.

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