SN74AUP1G58 - 低功耗可配置多功能门

SN74AUP1G58是TI德州仪器公司的一款无产品，SN74AUP1G58是低功耗可配置多功能门，本站介绍了SN74AUP1G58的封装应用图解、特点和优点、功能等，并给出了与SN74AUP1G58相关的TI元器件型号供参考。

SN74AUP1G58 - 低功耗可配置多功能门 - 无 - 小尺寸逻辑器件 - 德州仪器

产品描述

产品特性

Available in the Texas Instruments NanoStar™ Packages
Low Static-Power Consumption (ICC = 0.9 µA Max)
Low Dynamic-Power Consumption (Cpd = 4.6 pF Typ at 3.3 V)
Low Input Capacitance (Ci = 1.5 pF Typ)
Low Noise – Overshoot and Undershoot <10% of VCC
Ioff Supports Partial-Power-Down Mode Operation
Includes Schmitt-Trigger Inputs
Wide Operating VCC Range of 0.8 V to 3.6 V
Optimized for 3.3-V Operation
3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
tpd = 5.5 ns Max at 3.3 V
Suitable for Point-to-Point Applications
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model (A114-B, Class II)
- 1000-V Charged-Device Model (C101)

NanoStar is a trademark of Texas Instruments

DESCRIPTION/ORDERING INFORMATION

The AUP family is TI’s premier solution to the industry’s low-power needs in battery-powered portable applications. This family ensures a very low static and dynamic power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity, which produces very low undershoot and overshoot characteristics.

The SN74AUP1G58 features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions AND, OR, NAND, NOR, XNOR, inverter, and noninverter. All inputs can be connected to VCC or GND.

The device functions as an independent gate with Schmitt-trigger inputs, which allow for slow input transition and better switching noise immunity at the input.

NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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