SN74LV393A-EP - 增强型产品双路 4 位二进制计数器

SN74LV393A-EP是TI德州仪器公司的一款计数器/算术/奇偶校验功能产品，SN74LV393A-EP是增强型产品双路 4 位二进制计数器，本站介绍了SN74LV393A-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LV393A-EP相关的TI元器件型号供参考。

SN74LV393A-EP - 增强型产品双路 4 位二进制计数器 - 计数器/算术/奇偶校验功能 - 特殊逻辑 - 德州仪器

产品描述

The SN74LV393A contains eight flip-flops and additional gating to implement two individual 4-bit counters in a single package. This device is designed for 2-V to 5.5-V VCC operation.

This device comprises two independent 4-bit binary counters, each having a clear (CLR) and a clock (CLK)\ input. The device changes state on the negative-going transition of the CLK\ pulse. N-bit binary counters can be implemented with each package, providing the capability of divide by 256. The SN74LV393A has parallel outputs from each counter stage so that any submultiple of the input count frequency is available for system timing signals.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 105°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 5.5-V VCC Operation
Max tpd of 14.5 ns at 5 V
Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C
Typical VOHV (Output VOH Undershoot) >2.3 V at VCC = 3.3 V, TA = 25°C
Ioff Supports Partial-Power-Down-Mode Operation
Dual 4-Bit Binary Counters With Individual Clocks
Direct Clear for Each 4-Bit Counter
Can Significantly Improve System Densities by Reducing Counter Package Count by 50 Percent

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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