SN74LV4051A-EP是TI公司的一款模拟多路复用器/多路解复用器产品，SN74LV4051A-EP是增强型产品 8 通道模拟多路复用器/多路解复用器，本页介绍了SN74LV4051A-EP的产品说明、应用、特性等，并给出了与SN74LV4051A-EP相关的TI元器件型号供参考。
SN74LV4051A-EP - 增强型产品 8 通道模拟多路复用器/多路解复用器 - 模拟多路复用器/多路解复用器 - 多路复用器/多路解复用器(Mux/Demux) - TI公司（Texas Instruments，德州仪器）
This 8-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.
The SN74LV4051A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –40°C to 105°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 2-V to 5.5-V VCC Operation
- Support Mixed-Mode Voltage Operation on All Ports
- High On-Off Output-Voltage Ratio
- Low Crosstalk Between Switches
- Individual Switch Controls
- Extremely Low Input Current
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
