TLC1543-EP - 具有串行控制 11 路模拟输入的增强型产品 10 位模数转换器

TLC1543-EP是TI德州仪器公司的一款精密ADC(<=10MSPS)产品，TLC1543-EP是具有串行控制 11 路模拟输入的增强型产品 10 位模数转换器，本站介绍了TLC1543-EP的封装应用图解、特点和优点、功能等，并给出了与TLC1543-EP相关的TI元器件型号供参考。

TLC1543-EP - 具有串行控制 11 路模拟输入的增强型产品 10 位模数转换器 - 精密ADC(<=10MSPS) - 模数转换器 - 德州仪器

产品描述

The TLC1542-EP and TLC1543-EP are CMOS 10-bit switched-capacitor successive-approximation analog-to-digital converters. These devices have three inputs, a 3-state output chip select (CS)\, input/output clock (I/O CLOCK), address input (ADDRESS), and data output (DATA OUT)] that provide a direct 4-wire interface to the serial port of a host processor. The TLC1542-EP and TLC1543-EP allow high-speed data transfers from the host.

In addition to a high-speed A/D converter and versatile control capability, the TLC1542-EP and TLC1543-EP have an on-chip 14-channel multiplexer that can select any one of 11 analog inputs or any one of three internal self-test voltages. The sample-and-hold function is automatic. At the end of the A/D conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the TLC1542-EP and TLC1543-EP feature differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating free-air temperature range.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree
10-Bit Resolution A/D Converter
11 Analog Input Channels
Three Built-In Self-Test Modes
Inherent Sample-and-Hold Function
Total Unadjusted Error . . . ±1 LSB Max
On-Chip System Clock
End-of-Conversion (EOC) Output
Terminal Compatible With TLC542
CMOS Technology

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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