UCC28C45-EP - BiCMOS 低功耗电流模式 PWM 控制器

UCC28C45-EP是TI德州仪器公司的一款PWM与谐振控制器产品，UCC28C45-EP是BiCMOS 低功耗电流模式 PWM 控制器，本站介绍了UCC28C45-EP的封装应用图解、特点和优点、功能等，并给出了与UCC28C45-EP相关的TI元器件型号供参考。

UCC28C45-EP - BiCMOS 低功耗电流模式 PWM 控制器 - PWM与谐振控制器 - 离线隔离型DC/DC控制器和转换器 - 德州仪器

产品描述

The UCC28C4x family are high performance current mode PWM controllers. They are enhanced BiCMOS versions with pin-for-pin compatibility to the industry standard UC284xA family and UC284x family of PWM controllers. In addition, lower startup voltage versions of 7 V are offered as UCC28C40 and UCC28C41.

Providing necessary features to control fixed frequency, peak current mode power supplies, this family offers several performance advantages. These devices offer high frequency operation up to 1 MHz with low start up and operating currents, thus minimizing start up loss and low operating power consumption for improved efficiency. The devices also feature a fast current sense to output delay time of 35 ns, and a ±1 A peak output current capability with improved rise and fall times for driving large external MOSFETs directly.

The UCC28C4x family is offered in 8-pin package SOIC (D).

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree(1)
Enhanced Replacements for UC2842A Family With Pin-to-Pin Compatibility
1 MHz Operation
50 µA Standby Current, 100 µA Maximum
Low Operating Current of 2.3 mA at 52 kHz
Fast 35 ns Cycle-by-Cycle Overcurrent Limiting
±1 A Peak Output Current
Rail-to-Rail Output Swings With 25 ns Rise and 20 ns Fall Times
±1% Initial Trimmed 2.5 V Error Amplifier Reference
Trimmed Oscillator Discharge Current
New Undervoltage Lockout Versions
MSOP-8 Package Minimizes Board Space
APPLICATIONS
- Switch Mode Power Supplies
- DC-to-DC Converters
- Board Mount Power Modules

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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