SM320VC5416-EP - 增强型产品定点数字信号处理器

SM320VC5416-EP是TI德州仪器公司的一款C5000DSP产品，SM320VC5416-EP是增强型产品定点数字信号处理器，本站介绍了SM320VC5416-EP的封装应用图解、特点和优点、功能等，并给出了与SM320VC5416-EP相关的TI元器件型号供参考。

SM320VC5416-EP - 增强型产品定点数字信号处理器 - C5000DSP - 数字信号处理器 - 德州仪器

产品描述

The SM320VC5416 fixed-point, digital signal processor (DSP) (hereafter referred to as the 5416 unless otherwise specified) is based on an advanced modified Harvard architecture that has one program memory bus and three data memory buses. This processor provides an arithmetic logic unit (ALU) with a high degree of parallelism, application-specific hardware logic, on-chip memory, and additional on-chip peripherals. The basis of the operational flexibility and speed of this DSP is a highly specialized instruction set.

Separate program and data spaces allow simultaneous access to program instructions and data, providing a high degree of parallelism. Two read operations and one write operation can be performed in a single cycle. Instructions with parallel store and application-specific instructions can fully utilize this architecture. In addition, data can be transferred between data and program spaces. Such parallelism supports a powerful set of arithmetic, logic, and bit-manipulation operations that can all be performed in a single machine cycle. The 5416 also includes the control mechanisms to manage interrupts, repeated operations, and function calls.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Advanced Multibus Architecture With Three Separate 16-Bit Data Memory Buses and One Program Memory Bus
40-Bit Arithmetic Logic Unit (ALU) Including a 40-Bit Barrel Shifter and Two Independent 40-Bit Accumulators
17- × 17-Bit Parallel Multiplier Coupled to a 40-Bit Dedicated Adder for Non-Pipelined Single-Cycle Multiply/Accumulate (MAC) Operation
Compare, Select, and Store Unit (CSSU) for the Add/Compare Selection of the Viterbi Operator
Exponent Encoder to Compute an Exponent Value of a 40-Bit Accumulator Value in a Single Cycle
Two Address Generators With Eight Auxiliary Registers and Two Auxiliary Register Arithmetic Units (ARAUs)
Data Bus With a Bus Holder Feature
Extended Addressing Mode for 8M × 16-Bit Maximum Addressable External Program Space
128K x 16-Bit On-Chip RAM Composed of:
- Eight Blocks of 8K × 16-Bit On-Chip Dual-Access Program/Data RAM
- Eight Blocks of 8K × 16-Bit On-Chip Single-Access Program RAM
16K × 16-Bit On-Chip ROM Configured for Program Memory
Enhanced External Parallel Interface (XIO2)
Single-Instruction-Repeat and Block-Repeat Operations for Program Code
Block-Memory-Move Instructions for Better Program and Data Management
Instructions With a 32-Bit Long Word Operand
Instructions With Two- or Three-Operand Reads
Arithmetic Instructions With Parallel Store and Parallel Load
Conditional Store Instructions
Fast Return From Interrupt
On-Chip Peripherals
- Software-Programmable Wait-State Generator and Programmable Bank-Switching
- On-Chip Programmable Phase-Locked Loop (PLL) Clock Generator With External Clock Source
- One 16-Bit Timer
- Six-Channel Direct Memory Access (DMA) Controller
- Three Multichannel Buffered Serial Ports (McBSPs)
- 8/16-Bit Enhanced Parallel Host-Port Interface (HPI8/16)
Power Consumption Control With IDLE1, IDLE2, and IDLE3 Instructions With Power-Down Modes
CLKOUT Off Control to Disable CLKOUT
On-Chip Scan-Based Emulation Logic, IEEE Std 1149.1 (JTAG) Boundary Scan Logic
144-Pin Ball Grid Array (BGA) (GGU Suffix)
144-Pin Low-Profile Quad Flatpack (LQFP) (PGE Suffix)
6.25-ns Single-Cycle Fixed-Point Instruction Execution Time (160 MIPS)
3.3-V I/O Supply Voltage
1.6-V Core Supply Voltage

All trademarks are the property of their respective owners. Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture. TMS320C54x and MicroStar BGA are trademarks of Texas Instruments.

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