SN74ALVC00-EP是TI公司的一款与非门产品，SN74ALVC00-EP是增强型产品四路 2 输入正与非门，本页介绍了SN74ALVC00-EP的产品说明、应用、特性等，并给出了与SN74ALVC00-EP相关的TI元器件型号供参考。
SN74ALVC00-EP - 增强型产品四路 2 输入正与非门 - 与非门 - 门 - TI公司（Texas Instruments，德州仪器）
The SN74ALVC00 quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.
The device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
- Operates From 1.65 V to 3.6 V
- Max tpd of 3 ns at 3.3 V
- ±24-mA Output Drive at 3.3 V
- Latch-Up Performance Exceeds 250 mA Per JESD 17
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
