SN74LV8154-EP - 具有三态输出寄存器的增强型产品双路 16 位二进制计数器

SN74LV8154-EP是TI德州仪器公司的一款计数器/算术/奇偶校验功能产品，SN74LV8154-EP是具有三态输出寄存器的增强型产品双路 16 位二进制计数器，本站介绍了SN74LV8154-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LV8154-EP相关的TI元器件型号供参考。

SN74LV8154-EP - 具有三态输出寄存器的增强型产品双路 16 位二进制计数器 - 计数器/算术/奇偶校验功能 - 特殊逻辑 - 德州仪器

产品描述

The SN74LV8154 is a dual 16 bit binary counter with 3-state output registers, designed for 2-V to 5.5-V VCC operation.

This 16 bit counter (A or B) feeds a 16 bit storage register and each storage register is further divided into an upper byte and lower byte. The GAL, GAU, GBL, and GBU inputs are used to select the byte that needs to be output at Y0-Y7. CLKA is the clock for A counter and CLKB is the clock for B counter. RCLK is the clock for the A and B storage registers. All three clock signals are positive-edge triggered.

A 32 bit counter can be realized by connecting CLKA and CLKB together and by connecting RCOA to CLKBEN.

To ensure the high-impedance state during power up or power down, GAL, GAU, GBL, and GBU should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

产品特性

Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree(1)
Can Be Used as Two 16 Bit Counters or a Single 32 Bit Counter
2-V to 5.5-V VCC Operation
Max tpd of 25 ns at 5 V (RCLK to Y)
Typical VOLP (Output Ground Bounce) <0.7 V at VCC = 5 V, TA = 25°C
Typical VOHV (Output VOH Undershoot) >4.4 V at VCC = 5 V, TA = 25°C
Ioff Supports Partial-Power-Down Mode Operation
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

下面可能是您感兴趣的TI德州仪器公司计数器/算术/奇偶校验功能元器件

TI公司产品现货专家，订购TI公司产品不限最低起订量，TI芯片大陆现货即时发货，香港库存3-5天发货，海外库存7-10天发货

寻找全球TI代理商现货货源 - TI公司（德州仪器）电子元件在线订购