SN74LVC1G97-EP - 增强型产品可配置多功能门

SN74LVC1G97-EP是TI德州仪器公司的一款无产品，SN74LVC1G97-EP是增强型产品可配置多功能门，本站介绍了SN74LVC1G97-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LVC1G97-EP相关的TI元器件型号供参考。

SN74LVC1G97-EP - 增强型产品可配置多功能门 - 无 - 小尺寸逻辑器件 - 德州仪器

产品描述

This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G97 features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCC or GND.

This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT–) signals.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Supports 5-V VCC Operation
Inputs Accept Voltages to 5.5 V
Max tpd of 6.3 ns at 3.3 V
Low Power Consumption, 10-µA Max ICC
±24-mA Output Drive at 3.3 V
Ioff Supports Partial-Power-Down Mode Operation
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
Choose From Nine Specific Logic Functions

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and moldcompound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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