SN74LVTH162373-EP - 具有三态输出的增强型产品 3.3V Abt 16 位透明 D 类锁存器

SN74LVTH162373-EP是TI德州仪器公司的一款D类锁存器产品，SN74LVTH162373-EP是具有三态输出的增强型产品 3.3V Abt 16 位透明 D 类锁存器，本站介绍了SN74LVTH162373-EP的封装应用图解、特点和优点、功能等，并给出了与SN74LVTH162373-EP相关的TI元器件型号供参考。

SN74LVTH162373-EP - 具有三态输出的增强型产品 3.3V Abt 16 位透明 D 类锁存器 - D类锁存器 - 触发器/锁存器/寄存器 - 德州仪器

产品描述

产品特性

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree(1)
Member of the Texas Instruments Widebus™ Family
Output Ports Have Equivalent 22- Series Resistors, So No External Resistors Are Required
Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Supports Unregulated Battery Operation Down to 2.7 V
Typical VOLP (Output Ground Bounce) <:0.8 V at VCC = 3.3 V, TA = 25°C
Ioff and Power-Up 3-State Support Hot Insertion
Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
Distributed VCC and GND Pins Minimize High-Speed Switching Noise
Flow-Through Architecture Optimizes PCB Layout
Latch-Up Performance Exceeds 500 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)

Widebus is a trademark of Texas Instruments. (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

DESCRIPTION/ORDERING INFORMATION

The SN74LVTH162373 is a 16-bit transparent D-type latch with 3-state outputs designed for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. This device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without interface or pullup components.

OE does not affect internal operations of the latch. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

The outputs, which are designed to source or sink up to 12 mA, include equivalent 22- series resistors to reduce overshoot and undershoot.

Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

When VCC is between 0 and 1.5 V, the device is in the high-impedance state during power up or power down. However, to ensure the high-impedance state above 1.5 V, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This device is fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.

This device can be used as two 8-bit latches or one 16-bit latch. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the levels set up at the D inputs.

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