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- DCP022405DU/1K - 板安装电源 > 直流转换器



SN74AUP1G125 - 具有三态输出的低功耗单路总线缓冲器门
SN74AUP1G125是TI德州仪器公司的一款无产品,SN74AUP1G125是具有三态输出的低功耗单路总线缓冲器门,本站介绍了SN74AUP1G125的封装应用图解、特点和优点、功能等,并给出了与SN74AUP1G125相关的TI元器件型号供参考。
SN74AUP1G125 - 具有三态输出的低功耗单路总线缓冲器门 - 无 - 小尺寸逻辑器件 - 德州仪器
The AUP family is TIs premier solution to the industry's low-power needs in battery-powered portable applications. This family ensures a very low static and dynamic power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity.
This bus buffer gate is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input is high. This device has the input-disable feature, which allows floating input signals.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
- Available in the Texas Instruments NanoStar Package
- Low Static-Power Consumption (ICC = 0.9 µA Max)
- Low Dynamic-Power Consumption (Cpd = 4 pF Typ at 3.3 V)
- Low Input Capacitance (CI = 1.5 pF Typ)
- Low Noise Overshoot and Undershoot <10% of VCC
- Input-Disable Feature Allows Floating Input Conditions
- Ioff Supports Partial-Power-Down Mode Operation
- Input Hysteresis Allows Slow Input Transition and Better Switching Noise Immunity at Input
- Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 4.6 ns Max at 3.3 V
- Suitable for Point-to-Point Applications
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model (A114-B, Class II)
- 1000-V Charged-Device Model (C101)
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